Memory-efficient, multithreaded engines utilize available server cores to speed up automatic test pattern generation (ATPG) and silicon diagnosis Twenty-five percent fewer test patterns reduce test ...

Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on ICs continues to double every 18 to 24 ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

To design complex ASICs in a timely and cost-effective manner, engineers must incorporate various design-for-test (DFT) methodologies. Early on, for example, they must add boundary as well as internal ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...